Corvallis, OR, United States of America

John R Cronkrite

This inventor holds 1 USPTO granted patent. Top assignee: Hewlett-Packard Development Company, L.p.. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John R Cronkrite. Retrieved from https://idiyas.com/inventor/john-r-cronkrite

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: John R. Cronkrite and Photographic-Quality Printing

Introduction

John R. Cronkrite is an inventor associated with Corvallis, Oregon, and Hewlett-Packard Development Company, L.P. His patent work addresses methods and materials for producing photographic-quality prints.

Latest Patents

Cronkrite is credited with 1 patent: “Photographic-Quality Prints and Methods for Making the Same.” The patent describes prints made with three general layers: a transparent carrier that receives an image, the image itself, and a particle-based undercoat applied to the image-bearing side of the carrier. The image may be produced using inkjet, electrostatic, or other imaging techniques, including reverse printing. The disclosure also describes an apparatus for producing prints using these methods.

Career Highlights

Cronkrite’s listed invention focuses on print construction and production, combining a transparent image-receiving substrate with a particle-based undercoat. His work is associated with Hewlett-Packard Development Company, L.P.

Collaborations

The listed coworkers associated with Cronkrite include David Michael Kwasny and George C. Ross.

Conclusion

John R. Cronkrite’s patent documents an approach to photographic-quality printing that brings together a transparent carrier, an image, and a particle-based undercoat.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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