John P Stewart

Title: Innovations of John P Stewart

Introduction

John P Stewart is a notable inventor based in Seattle, WA, with a remarkable portfolio of six patents. His work primarily focuses on advancements in semiconductor technology and precision instrumentation.

Latest Patents

One of his latest patents is the "Probe card array check plate with transition zones." This invention provides a probe card array check plate designed with transition zones to prevent a semiconductor probe from impacting an epoxy joint during an over travel test. The transition zones feature beveled edges or tapers between the first and second testing surfaces. In alternate embodiments, different types of testing surfaces are juxtaposed, or an optical measurement window is sufficiently large to prevent an over-traveling probe tip from entering an epoxied area. Another significant patent is the "Orthogonal high accuracy microscope stage." This invention utilizes three frames for orthogonal motion, with the lower frame featuring a series of downwardly depending ramps. An actuator plate, with correspondingly positioned upwardly directed ramps, is translated with respect to the lower frame to facilitate precise raising and lowering of the frames.

Career Highlights

John P Stewart has made significant contributions to the field of precision instrumentation and semiconductor testing. His innovative designs have enhanced the accuracy and reliability of testing processes in various applications.

Collaborations

Throughout his career, John has collaborated with esteemed colleagues, including Ronald C Seubert and Donald B Snow. Their combined expertise has contributed to the successful development of advanced technologies.

Conclusion

John P Stewart's contributions to innovation in semiconductor technology and precision instrumentation are noteworthy. His patents reflect a commitment to enhancing the functionality and accuracy of testing equipment.