Fremont, CA, United States of America

John P Myers

This inventor holds 1 USPTO granted patent, plus 1 CIPO patent. Top assignee: Analog Devices,inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John P Myers. Retrieved from https://idiyas.com/inventor/john-p-myers-99b1ec1j

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: John P Myers: Innovator in Signal Strength Detection

Introduction

John P Myers is a notable inventor based in Fremont, CA (US). He has made significant contributions to the field of signal strength detection, particularly through his innovative patent.

Latest Patents

John P Myers holds a patent for "Intercept-temperature drift calibration of a signal strength detector." This device includes an intercept-temperature drift input to receive an intercept-temperature drift value. It also features a reference current generator that generates a reference current based at least in part on the intercept-temperature drift value. Additionally, the device incorporates an analog signal chain that adjusts a slope-temperature drift of the signal-strength detector by modifying a delta proportional to the absolute temperature of the analog signal chain. He has 1 patent to his name.

Career Highlights

John P Myers is currently employed at Analog Devices, Inc., where he continues to work on advancements in technology related to signal detection. His expertise and innovative approach have made him a valuable asset to the company.

Collaborations

One of his notable coworkers is Daniel J Linebarger, with whom he collaborates on various projects within the company.

Conclusion

John P Myers is a distinguished inventor whose work in signal strength detection has led to valuable advancements in technology. His contributions continue to impact the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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