This inventor holds 1 USPTO granted patent. Top assignee: Texas Research International, Inc.. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: John Nagel - Innovator in Nondestructive Inspection Technologies
Introduction
John Nagel is a prominent inventor based in Austin, TX, known for his contributions to nondestructive inspection (NDI) technologies. With a focus on enhancing the safety and reliability of multi-layered metallic structures, Nagel has developed innovative solutions that address critical challenges in the field.
Latest Patents
Nagel holds a patent for a groundbreaking invention titled "Multilayer Bolthole Nondestructive Inspection (NDI)." This patent focuses on the use of NDI capabilities to detect fatigue cracks that extend from fastener holes in multi-layered metallic structures. The innovative approach allows for inspection without the need to remove fasteners, utilizing a probe guide equipped with a UT sensor and either an inertial measurement unit (IMU) or a rotary encoder. This technology can be applied in testing both raised head fasteners and flush fasteners, significantly improving inspection efficiency.
Career Highlights
John Nagel is associated with Texas Research International, Inc., where he continues to advance his research and development efforts. His work has been instrumental in pushing the boundaries of nondestructive testing methodologies, ensuring that safety standards are met in various engineering applications.
Collaborations
Nagel collaborates with notable professionals in his field, including Mark Warchol and David Forsyth. These partnerships enhance the innovation process and contribute to the successful implementation of advanced inspection technologies.
Conclusion
John Nagel's contributions to nondestructive inspection technologies exemplify the importance of innovation in engineering. His patented work not only addresses critical safety concerns but also paves the way for future advancements in the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile