Longford, Ireland

John Mallon

This inventor holds 1 USPTO granted patent. Top assignee: Dublin City University. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John Mallon. Retrieved from https://idiyas.com/inventor/john-mallon-ensvhrvr

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 28(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: John Mallon: Innovator in Lens Distortion Calibration

Introduction

John Mallon is a notable inventor based in Longford, Ireland. He has made significant contributions to the field of optical engineering, particularly in the calibration and removal of lens distortion. His innovative approach has the potential to enhance image quality in various applications.

Latest Patents

Mallon holds a patent for a "Method for high precision lens distortion calibration and removal." This patent describes a high precision method for calibrating and removing distortion from a lens. The method involves arranging sensor readings to compensate for distortion while simultaneously optimizing the resulting image magnification for the best image quality. This innovation is crucial for improving the performance of optical systems.

Career Highlights

John Mallon is affiliated with Dublin City University, where he continues to advance his research and development in optical technologies. His work has garnered attention for its practical applications in enhancing imaging systems.

Collaborations

Mallon collaborates with Paul Francis Whelan, a fellow researcher, to further explore advancements in lens technology. Their partnership aims to push the boundaries of optical engineering and improve the quality of imaging systems.

Conclusion

John Mallon's contributions to lens distortion calibration represent a significant advancement in optical engineering. His innovative methods and collaborations continue to pave the way for improved image quality in various fields.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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