South Burlington, VT, United States of America

John M Aitren


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 113(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: The Innovations of John M Aitren

Introduction

John M Aitren is a notable inventor based in South Burlington, VT (US). He has made significant contributions to the field of technology, particularly in the area of device reliability studies. His work has been recognized for its innovative approach to testing devices on a wafer.

Latest Patents

John M Aitren holds 1 patent for his invention titled "Methodology and apparatus using real-time optical signal for wafer-level device dielectrical reliability studies." This patent describes a method and structure that tests devices on a wafer by applying an electrical bias to the devices while simultaneously monitoring the emitted light from all of the devices. The emitted light serves to indicate the locations of defective devices and records time-based images of the emitted light across the wafer.

Career Highlights

Aitren is currently employed at International Business Machines Corporation, commonly known as IBM. His role at IBM allows him to work on cutting-edge technologies and contribute to advancements in the field of electronics and device reliability.

Collaborations

Throughout his career, John has collaborated with talented individuals such as Fen Chen and Kevin L Condon. These collaborations have further enhanced his work and contributed to the success of his projects.

Conclusion

John M Aitren's innovative approach to device testing and reliability has made a significant impact in the technology sector. His contributions continue to influence advancements in the field, showcasing the importance of innovation in driving progress.

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