Birmingham, United Kingdom

John Lee-Edghill

This inventor holds 1 USPTO granted patent and 9 published patent applications. Top assignee: Bioaccel. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John Lee-Edghill. Retrieved from https://idiyas.com/inventor/john-lee-edghill

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 10.0

ph-index = 1

Forward Citations = 24(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of John Lee-Edghill

Introduction

John Lee-Edghill is a notable inventor based in Birmingham, GB. He has made significant contributions to the field of performance instruments and analysis methods. His work focuses on integrating multiple process steps into a continuous operation, enhancing efficiency and accuracy.

Latest Patents

John holds 1 patent that details instruments, devices, and methods of analysis. This patent emphasizes accurate positioning and full contact between components, facilitated by the relative movement allowed by his designs. Additionally, it describes an effective interface between a low-cost disposable cartridge or device and the instrument designed to process it.

Career Highlights

John is currently associated with Bioaccel, where he applies his innovative ideas to develop advanced analytical instruments. His work has been instrumental in pushing the boundaries of performance analysis in various applications.

Collaborations

John has collaborated with notable professionals in his field, including Frederic Zenhausern and Alan Nordquist. Their combined expertise has contributed to the advancement of technologies in performance instruments.

Conclusion

John Lee-Edghill's innovative work in performance instruments and methods of analysis showcases his commitment to enhancing operational efficiency. His contributions continue to impact the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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