Santa Barbara, CA, United States of America

John Langan

This inventor holds 1 USPTO granted patent. Top assignee: US Government as Represented by the Secretary of the Army. Active years: 1994.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John Langan. Retrieved from https://idiyas.com/inventor/john-langan-9yid10xo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 1994

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1 patent (USPTO):Explore Patents

Title: John Langan: Innovator in Solderability Testing

Introduction

John Langan is a notable inventor based in Santa Barbara, CA. He has made significant contributions to the field of solderability testing, particularly through his innovative methodologies. His work is essential for ensuring the reliability of printed circuit boards and printed wiring boards.

Latest Patents

John Langan holds a patent for a "Solderability Tester Methodology." This invention provides a method for gauging the solderability of printed circuit boards or printed wiring boards using differential reflectometry techniques. The method facilitates the determination of solderability properties of a substrate in a non-destructive manner. He has 1 patent to his name.

Career Highlights

Langan is currently employed by the U.S. Government as represented by the Secretary of the Army. His role involves applying his expertise in solderability testing to enhance the quality and reliability of military electronic components.

Collaborations

John has collaborated with notable colleagues such as Brett Piekarski and George K. Lucey, Jr. Their combined efforts contribute to advancements in the field of electronics and solderability testing.

Conclusion

John Langan's innovative work in solderability testing has made a significant impact on the reliability of electronic components. His contributions continue to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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