Olathe, KS, United States of America

John Joseph Fortino

This inventor holds 2 USPTO granted patents. Top assignee: Stone Lock Global, Inc.. Active years: 2021-2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John Joseph Fortino. Retrieved from https://idiyas.com/inventor/john-joseph-fortino

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.4

ph-index = 2

Forward Citations = 12(Granted Patents)


Company Filing History:


Years Active: 2021-2023

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2 patents (USPTO):Explore Patents

Title: Innovator Spotlight: John Joseph Fortino

Introduction

John Joseph Fortino is a notable inventor based in Olathe, Kansas, recognized for his contributions to technology with his innovative designs. With a total of two patents to his name, Fortino has made significant strides in the field of biometric security devices.

Latest Patents

Among his latest inventions, Fortino developed a biometric scanner and an edge device that enhance security measures in various applications. These inventions demonstrate his commitment to creating advanced technological solutions that cater to modern security needs.

Career Highlights

Fortino is employed at Stone Lock Global, Inc., a company known for its focus on biometric security systems. His role at the firm allows him to leverage his inventive skills to bring cutting-edge technology to fruition.

Collaborations

Throughout his career, Fortino has collaborated with industry professionals such as David Douglas Dunlap and Yanik Joseph Jacques Brunet. These partnerships underscore the importance of teamwork in driving innovation and advancing technological frontiers.

Conclusion

John Joseph Fortino exemplifies the spirit of innovation with his impactful inventions in biometric technology. As he continues to work at Stone Lock Global, Inc., his contributions are expected to play a vital role in shaping the future of security solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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