Seattle, WA, United States of America

John Hayes

This inventor holds 1 USPTO granted patent and 1 published patent application, plus 2 CIPO patents. Top assignee: Celartem, Inc.. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John Hayes. Retrieved from https://idiyas.com/inventor/john-hayes-c1qt2b6m

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 51(Granted Patents)


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: John Hayes - Innovator in LIDAR Technology

Introduction

John Hayes is an accomplished inventor based in Seattle, WA. He has made significant contributions to the field of LIDAR technology, particularly in data compression techniques. His innovative approach addresses the challenges posed by the massive amounts of data generated by LIDAR systems.

Latest Patents

John Hayes holds a patent for LIDAR point cloud compression. This invention focuses on converting point clouds into a format that allows for nearly lossless compression through wavelet transformation. This technique is crucial for managing the terabytes of data produced by LIDAR technology, making computation, transmission, and storage more efficient.

Career Highlights

Hayes is currently employed at Celartem, Inc., where he continues to develop cutting-edge solutions in data processing. His work has garnered attention for its potential to revolutionize how LIDAR data is utilized in various applications.

Collaborations

Some of his notable coworkers include Darrin Swanson and Laurie Sanders, who contribute to the innovative environment at Celartem, Inc.

Conclusion

John Hayes is a key figure in the advancement of LIDAR technology, with his patent on point cloud compression showcasing his innovative spirit. His contributions are paving the way for more efficient data management in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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