John G Deshayes

Title: Innovations by John G Deshayes

Introduction

John G Deshayes is an accomplished inventor based in Leominster, MA (US). He has made significant contributions to the field of electronics, particularly in the area of circuit testing. His innovative approach has led to the development of a unique method that enhances the efficiency of in-circuit testing.

Latest Patents

John G Deshayes holds a patent for a "Method for testing mixed scan and non-scan circuitry." This method allows for in-circuit testing of interior points of circuit boards that contain both boundary-scan and non-scan components. The procedure involves isolating non-scan components and either driving or sensing voltages at accessible test sites. This innovative method utilizes isolation and multiplexing solutions typically developed for in-circuit testing, resulting in a more efficient design and implementation of interconnect tests.

Career Highlights

Deshayes has had a notable career at Genrad, Inc., where he has applied his expertise in circuit testing. His work has contributed to advancements in the testing of electronic components, making significant impacts in the industry. His dedication to innovation has positioned him as a key figure in his field.

Collaborations

John G Deshayes has collaborated with Gordon D Robinson, further enhancing the development of testing methodologies in electronics. Their partnership has fostered a creative environment that encourages innovation and problem-solving.

Conclusion

John G Deshayes is a prominent inventor whose work in circuit testing has paved the way for more efficient methodologies in the electronics industry. His contributions continue to influence the field and inspire future innovations.