Palm Harbor, FL, United States of America

John G Demas

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 1996.


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:

goldMedal1 out of 834,411 
Other
 patents

Years Active: 1996

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1 patent (USPTO):Explore Patents

Title: John G Demas - Innovator in Distance Measurement Technology

Introduction

John G Demas is a notable inventor based in Palm Harbor, FL (US). He has made significant contributions to the field of distance measurement technology. With a focus on innovation, he has developed a unique system that enhances the accuracy of distance measurements.

Latest Patents

John G Demas holds a patent for a distance measuring system. This system comprises a base unit and a remote unit. The remote unit transmits a first radio frequency signal to the base unit. Upon receiving this signal, the base unit transmits a second radio frequency signal back to the remote unit. The remote unit measures the time interval between the transmission of the first signal and the receipt of the second signal. This process allows for the accurate determination of the distance between the two units. The accuracy of the measured distance can be further improved by averaging additional measurement cycles. He has 1 patent to his name.

Career Highlights

Throughout his career, John G Demas has demonstrated a commitment to advancing technology in distance measurement. His innovative approach has set a benchmark in the industry, showcasing his expertise and dedication to his craft.

Collaborations

John has worked alongside notable colleagues, including James G Demas and Nicholas G Demas. Their collaborative efforts have contributed to the development of advanced technologies in their respective fields.

Conclusion

John G Demas is a distinguished inventor whose work in distance measurement technology has made a lasting impact. His innovative patent reflects his dedication to enhancing accuracy in measurements.

Profile summary based on public USPTO records.
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