Enfield, CT, United States of America

John G Clark

This inventor holds 1 USPTO granted patent. Top assignee: Amdata, Inc.. Active years: 1992.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John G Clark. Retrieved from https://idiyas.com/inventor/john-g-clark-slgaafou

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 1992

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1 patent (USPTO):Explore Patents

Title: John G. Clark: Innovator in Infrared Imaging Inspections

Introduction

John G. Clark is a notable inventor based in Enfield, CT (US). He has made significant contributions to the field of infrared imaging inspections. His innovative approach has led to the development of a unique apparatus that enhances the inspection process of substrates.

Latest Patents

John G. Clark holds a patent for an "Apparatus for infrared imaging inspections." This invention provides a method for nondestructively identifying regions of high density in a substrate of a bonded matrix of carbon fibers. The process involves resistively heating the substrate and capturing an infrared image of the heated substrate. This technology is crucial for various applications where material integrity is essential.

Career Highlights

Clark is currently employed at Amdata, Inc., where he continues to work on advancements in imaging technology. His expertise in infrared imaging has positioned him as a valuable asset to his company and the industry at large.

Collaborations

One of his notable coworkers is Mark A. Sapia, with whom he collaborates on various projects. Their combined efforts contribute to the innovative environment at Amdata, Inc.

Conclusion

John G. Clark's work in infrared imaging inspections exemplifies the impact of innovation in technology. His patent and ongoing contributions reflect his commitment to advancing the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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