This inventor holds 4 USPTO granted patents. Top assignees: General Electric Company, Ge Medical Systems Global Technology Company, LLC. Active years: 2003-2009.
IDiyas Innovation Intelligence. (2026). Inventor Profile: John French. Retrieved from https://idiyas.com/inventor/john-french
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Calculating rank
% Patents Active = 25.0
Average Co-Inventor Count = 3.7
ph-index = 2
Forward Citations = 30(Granted Patents)
Company Filing History:

General Electric Company

Ge Medical Systems Global Technology Company, LLC
Years Active: 2003-2009
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4 patents (USPTO):Explore Patents
1. 7617601 - Manufacturing process for smaller active areas in flat panel X-ray detectors (2009-11-17),
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Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
IDiyas Innovation Intelligence. (2026). Inventor Profile: John French. Retrieved from https://idiyas.com/inventor/john-french
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]