Silverdale, WA, United States of America

John Fortelny

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John Fortelny. Retrieved from https://idiyas.com/inventor/john-fortelny

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Biography of Inventor John Fortelny

Introduction: John Fortelny is an accomplished inventor based in Silverdale, WA (US). He has made significant contributions to the field of technology, particularly in the area of virtual machine image management.

Latest Patents: John holds a patent for a system, program product, and method designed to accelerate the copying of virtual machine images. This innovative approach involves a target data processing system that utilizes an image library comprising multiple system images. The method allows for efficient transformation of a selected image into a copy of the virtual machine image by transferring only the necessary blocks from a source system.

Career Highlights: John Fortelny has had a notable career at International Business Machines Corporation (IBM). His work has focused on enhancing data processing systems and improving the efficiency of virtual machine operations.

Collaborations: Throughout his career, John has collaborated with esteemed colleagues, including Chitra Dorai and William J Hladik, Jr. These partnerships have contributed to the advancement of technology in their respective fields.

Conclusion: John Fortelny's innovative spirit and dedication to technology have led to valuable advancements in virtual machine image management. His contributions continue to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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