La Jolla, CA, United States of America

John F Hagey

This inventor holds 1 USPTO granted patent. Top assignee: Hewlett-Packard Company. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John F Hagey. Retrieved from https://idiyas.com/inventor/john-f-hagey

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 18(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: The Innovations of John F. Hagey

Introduction

John F. Hagey is a notable inventor based in La Jolla, California. He has made significant contributions to the field of technology, particularly in the area of multifunctional devices. His work has been recognized for its innovation and practicality.

Latest Patents

Hagey holds a patent for a combined printer, copier, scanner, and facsimile. This invention showcases his ability to integrate multiple functionalities into a single device, enhancing efficiency and convenience for users. He has 1 patent to his name, reflecting his commitment to innovation.

Career Highlights

Hagey is associated with Hewlett-Packard Company, a leader in technology and printing solutions. His role at the company has allowed him to contribute to advancements in printing technology and multifunctional devices. His work has had a lasting impact on the industry.

Collaborations

Throughout his career, Hagey has collaborated with talented individuals such as David W. Leong and John Herman Arterberry. These collaborations have fostered a creative environment that has led to innovative solutions in technology.

Conclusion

John F. Hagey is a distinguished inventor whose work in multifunctional devices has made a significant impact on the technology landscape. His contributions continue to influence the way we interact with printing and imaging technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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