John E Riley

Title: John E. Riley: Innovator in Semiconductor Testing

Introduction

John E. Riley is a notable inventor based in Katy, Texas, recognized for his contributions to the field of semiconductor technology. He has developed a significant patent that enhances the testing processes for semiconductor devices, particularly focusing on serial access memory.

Latest Patents

Riley holds a patent for a "Method and device for testing a semiconductor serial access memory." This invention outlines a method and apparatus for testing a semiconductor serial access memory device through a main memory. The process involves generating test data and expected test data, storing the test data in the main memory, and sending it to the serial access memory. The test data is then returned to the main memory for comparison with the expected data, producing an output that indicates whether the data matches or differs.

Career Highlights

John E. Riley is associated with Texas Instruments Corporation, a leading company in semiconductor design and manufacturing. His work at Texas Instruments has allowed him to contribute to advancements in memory testing technologies, showcasing his expertise in the field.

Collaborations

Riley has collaborated with notable colleagues, including Timothy D. Dorney and Steven C. Eplett. These collaborations have likely fostered innovation and development within their projects at Texas Instruments.

Conclusion

John E. Riley's innovative work in semiconductor testing exemplifies the importance of advancements in technology. His patent reflects a significant contribution to the efficiency and accuracy of memory testing processes.