Milpitas, CA, United States of America

John David Allard

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Roche Palo Alto LLC. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John David Allard. Retrieved from https://idiyas.com/inventor/john-david-allard-zonkwtto

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile



Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: John David Allard: Innovator in Genotoxicity Assessment

Introduction

John David Allard is a notable inventor based in Milpitas, CA (US). He has made significant contributions to the field of genotoxicity assessment through his innovative methods and reagents. His work focuses on determining the genotoxicity of compounds based on genomic responses.

Latest Patents

Allard holds a patent titled "Method for determining genotoxicity." This patent provides methods and reagents for assessing the genotoxicity of a compound by analyzing genomic responses upon contact with the substance. He has 1 patent to his name, showcasing his expertise in this specialized area.

Career Highlights

Throughout his career, John David Allard has worked with prominent companies in the pharmaceutical industry, including Roche Palo Alto LLC and F. Hoffmann-La Roche AG. His experience in these organizations has allowed him to develop and refine his innovative approaches to genotoxicity testing.

Collaborations

Allard has collaborated with esteemed colleagues such as Guochun Liao and Gary A. Peltz. These partnerships have contributed to the advancement of research in the field of genotoxicity.

Conclusion

John David Allard's contributions to the field of genotoxicity through his patent and collaborations highlight his role as an innovator. His work continues to influence the assessment of compound safety in the pharmaceutical industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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