Celina, TX, United States of America

John D Wolfe

This inventor holds 1 USPTO granted patent. Top assignee: Texas Instruments Corporation. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John D Wolfe. Retrieved from https://idiyas.com/inventor/john-d-wolfe

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: John D Wolfe - Innovator in Semiconductor Testing Technology.

Introduction

John D Wolfe is a notable inventor based in Celina, TX (US), recognized for his contributions to semiconductor testing technology. With a focus on enhancing the efficiency and accuracy of testing processes, Wolfe has made significant strides in the field.

Latest Patents

Wolfe holds a patent for a "Probe card and temperature stabilizer for testing semiconductor devices." This invention features an apparatus that includes a probe card with associated probe needles. A temperature stabilizer element is couplable to the probe card, designed to either raise or lower the temperature of the probe needles, thereby reducing their movement during testing. This innovation is crucial for improving the reliability of semiconductor device testing.

Career Highlights

Wolfe is currently employed at Texas Instruments Corporation, a leading company in the semiconductor industry. His work at Texas Instruments has allowed him to apply his innovative ideas in a practical setting, contributing to the advancement of technology in the field.

Collaborations

Some of his coworkers include Adolphus E McClanahan and Michael P Harris, who have likely collaborated with Wolfe on various projects within the company.

Conclusion

John D Wolfe's contributions to semiconductor testing technology exemplify the impact of innovation in the industry. His patent and work at Texas Instruments Corporation highlight his role as a key figure in advancing testing methodologies for semiconductor devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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