This inventor holds 2 USPTO granted patents. Top assignee: Rockwell International Corporation. Active years: 1985-1986.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1985-1986
Title: John C. Wauer: Innovator in FMCW Systems
Introduction
John C. Wauer is a notable inventor based in Cedar Rapids, Iowa. He has made significant contributions to the field of frequency-modulated continuous wave (FMCW) systems. With a total of 2 patents, Wauer's work focuses on enhancing the accuracy and functionality of distance measuring devices.
Latest Patents
Wauer's latest patents include "Nearest return tracking in an FMCW system" and "FMCW system for providing search-while-track functions and altitude rate." The first patent describes an FMCW distance measuring device that improves accuracy by providing nearest return tracking. This system utilizes a frequency discriminator to ensure that the output most accurately represents the nearest return, allowing for better altitude tracking compared to conventional systems. The second patent outlines a system that enables searching for nearer returns while tracking altitude, providing a more accurate determination of altitude rate through independent modulation of upsweep and downsweep signals.
Career Highlights
Wauer is currently employed at Rockwell International Corporation, where he continues to innovate in the field of FMCW technology. His work has been instrumental in advancing the capabilities of distance measuring systems, making them more reliable and efficient.
Collaborations
Wauer collaborates with Richard S. Haendel, contributing to the development of cutting-edge technologies in their field.
Conclusion
John C. Wauer's contributions to FMCW systems demonstrate his commitment to innovation and accuracy in distance measurement technology. His patents reflect a deep understanding of the complexities involved in altitude tracking and distance measurement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
