This inventor holds 1 USPTO granted patent. Top assignee: The United States of America as Represented by the United States. Active years: 1999.
Company Filing History:
Years Active: 1999
Title: John C Holecek: Innovator in Mass Spectroscopy
Introduction
John C Holecek is a notable inventor based in Colorado Springs, CO (US). He has made significant contributions to the field of mass spectroscopy, particularly through his innovative patent. His work focuses on advanced methods for analyzing surface characteristics of samples, which has implications in various scientific and industrial applications.
Latest Patents
John C Holecek holds a patent for a "Time-of-flight SIMS/MSRI reflectron mass analyzer and method." This invention provides a method and apparatus for analyzing surface characteristics using Secondary Ion Mass Spectroscopy (SIMS) and Mass Spectroscopy of Recoiled Ions (MSRI). The method involves detecting back scattered primary ions and various ejected species through ion beam surface analysis techniques. The patent outlines specific configurations for the mass analyzer, including the positioning angle and voltage settings necessary for accurate measurements. He has 1 patent to his name.
Career Highlights
Throughout his career, John C Holecek has been associated with the United States of America as represented by the United States. His work has contributed to advancements in mass spectroscopy, enhancing the capabilities of surface analysis techniques.
Collaborations
John has collaborated with notable colleagues, including Vincent Scott Smentkowski and Dieter M Gruen. Their combined expertise has likely fostered innovative approaches in their respective fields.
Conclusion
John C Holecek's contributions to mass spectroscopy through his patented methods demonstrate his commitment to advancing scientific research. His work continues to influence the field and showcases the importance of innovation in technology.