John Bucher

Title: The Innovative Contributions of John Bucher

Introduction

John Bucher is a notable inventor based in Corcoran, MN (US). He has made significant contributions to the field of microcircuit testing systems. His innovative approach to thermal management has led to the development of a unique patent that enhances the efficiency of testing integrated circuits.

Latest Patents

John Bucher holds a patent for a "Thermal management for microcircuit testing system." This invention provides a system and method for thermal management of test pins. The IC test system features a test pin array mounted in a pin guide, which is located in a retainer between an IC wafer containing devices to be tested and a load board that facilitates test signal pathways. The design includes a contact plate that straddles the load board, with leg extensions that create a thermal circuit from the contact plate to the retainer and pin array. Additionally, the system incorporates a cooling/heating mechanism with a thermal electric Peltier device and a heat exchanger, along with provisions for dry air supply to minimize condensation.

Career Highlights

John Bucher is associated with Johnstech International Corporation, where he applies his expertise in thermal management systems. His work has been instrumental in advancing the technology used in microcircuit testing.

Collaborations

John collaborates with notable colleagues, including David A. Johnson and Jeffrey C. Sherry. Their combined efforts contribute to the innovative environment at Johnstech International Corporation.

Conclusion

John Bucher's contributions to thermal management in microcircuit testing systems exemplify his innovative spirit and dedication to advancing technology. His patent reflects a significant step forward in improving testing efficiency and reliability.