Pittsburgh, PA, United States of America

John Bosley Manges

This inventor holds 1 USPTO granted patent. Top assignee: Sas IP, Inc.. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John Bosley Manges. Retrieved from https://idiyas.com/inventor/john-bosley-manges

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: John Bosley Manges: Innovator in Signal Integrity Simulation

Introduction

John Bosley Manges is a notable inventor based in Pittsburgh, PA (US). He has made significant contributions to the field of signal integrity simulation. His work focuses on developing systems and methods that enhance the understanding and performance of signal integrity structures.

Latest Patents

Manges holds a patent for "Simulating Signal Integrity Structures." This patent discloses systems and methods for simulating signal integrity structures using stable processed modes, such as matched traveling-wave power modes. It also covers the creation of response surfaces from stable response parameters. He has 1 patent to his name.

Career Highlights

Manges is currently associated with Sas IP, Inc., where he applies his expertise in signal integrity. His innovative approach has positioned him as a valuable asset in the field of electrical engineering.

Collaborations

Manges has collaborated with notable professionals, including J Eric Bracken and Lars Eric Rickard Petersson. These collaborations have further enriched his work and contributed to advancements in signal integrity.

Conclusion

John Bosley Manges is a distinguished inventor whose work in simulating signal integrity structures has made a significant impact in the field. His contributions continue to influence the development of advanced technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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