This inventor holds 1 USPTO granted patent. Top assignee: Advanced Gauging Technologies, LLC. Active years: 2024.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2024
Title: John Bihn - Innovator in Strip Width Measurement Technology
Introduction
John Bihn is an accomplished inventor based in Plain City, OH (US). He has made significant contributions to the field of measurement technology, particularly in the area of strip width measurement. His innovative approach has led to the development of a unique method and apparatus that enhances the accuracy of measuring strip widths.
Latest Patents
John Bihn holds a patent for a method titled "Strip width measurement with continuous hardware imperfection corrections of sensed edge positions." This invention provides a sophisticated solution for measuring the width of a strip or multiple strips being conveyed through a sensing region of a gauge. The apparatus features a correction bar with highly accurately machined edges and a laser point displacement sensor that traverses across the sensing region. The method utilizes the correction bar to sense edge distance positions and generate continuous corrections for all distance positions across the entire sensing region.
Career Highlights
John Bihn is currently associated with Advanced Gauging Technologies, LLC, where he applies his expertise in measurement technology. His work has been instrumental in advancing the capabilities of gauging systems, ensuring precision and reliability in strip width measurements.
Collaborations
Throughout his career, John has collaborated with talented professionals such as Todd Allen and Nick Hunkar. These collaborations have fostered an environment of innovation and have contributed to the success of their projects.
Conclusion
John Bihn's contributions to measurement technology exemplify the spirit of innovation. His patented methods and dedication to precision continue to influence the industry positively.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile