Lancaster, PA, United States of America

John Beiler

This inventor holds 2 USPTO granted patents and 1 published patent application. Top assignee: Metrologic Instruments, Inc.. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John Beiler. Retrieved from https://idiyas.com/inventor/john-beiler

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 2 

% Patents Active = 100.0

Average Co-Inventor Count = 11.0

ph-index = 2

Forward Citations = 513(Granted Patents)


Company Filing History:


Years Active: 2013

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2 patents (USPTO):Explore Patents

Title: John Beiler - Innovator from Lancaster, PA

Introduction: John Beiler is a renowned inventor hailing from Lancaster, Pennsylvania. With a passion for innovation and problem-solving, he has made significant contributions to various fields through his inventive spirit.

Latest Patents: John Beiler holds several patents in the areas of technology and engineering, showcasing his dedication to pushing the boundaries of what is possible. His latest patents focus on sustainable energy solutions and advanced manufacturing processes.

Career Highlights: Throughout his career, John Beiler has been recognized for his groundbreaking work in developing cutting-edge technologies. His innovative approach has led to advancements in renewable energy, transportation, and consumer electronics.

Collaborations: John Beiler has collaborated with leading research institutions, universities, and companies to bring his inventions to life. His partnerships have been instrumental in turning his visionary ideas into practical applications that benefit society as a whole.

Conclusion: John Beiler's impact on the world of innovation is undeniable, with his inventions shaping the way we live and work. His relentless pursuit of excellence and commitment to making a difference continue to inspire the next generation of inventors and innovators.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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