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For the Inventor, By the Inventor

Duluth, GA, United States of America

John Baird Keys

This inventor holds 8 USPTO granted patents. Top assignee: Ncr Corporation. Active years: 1989-2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John Baird Keys. Retrieved from https://idiyas.com/inventor/john-baird-keys

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 8

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 5

Forward Citations = 66(Granted Patents)


Location History:

  • Cambridge, OH (US) (1989)
  • Duluth, GA (US) (2002 - 2011)

Company Filing History:

goldMedal8 out of 4,492 
 
Ncr Corporation
 patents

Years Active: 1989-2011

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8 patents (USPTO):Explore Patents
1. 7931194 - Methods and apparatus for automated document examination for age verification (2011-04-26),
2. 6796503 - Methods and apparatus for dynamic adjustment of bar code reader parameters (2004-09-28),
3. 6695211 - Methods and apparatus for enhanced scanner operation employing bar code and bar code fragment time and position of data collection (2004-02-24),
4. 6651889 - Methods and apparatus for obtaining and maintaining position information for a rotating optical element in a bar code scanner (2003-11-25),
5. 6454169 - Methods and apparatus for obtaining and maintaining position information for a rotating optical element in a bar code scanner (2002-09-24),
6. 6394351 - Methods and apparatus for enhanced scanner operation employing bar code and bar code fragment time and position of data collection (2002-05-28),
7. 4884234 - Dynamic RAM refresh circuit with DMA access (1989-11-28),
8. 4797932 - Speaker volume control apparatus and method (1989-01-10),

Title: The Innovative Contributions of John Baird Keys

Introduction

John Baird Keys is a notable inventor based in Duluth, GA, with a remarkable portfolio of eight patents. His work primarily focuses on enhancing automated systems and improving the accuracy of document and barcode processing. Keys has made significant strides in the field of technology, particularly in age verification and barcode detection.

Latest Patents

Among his latest patents, Keys has developed methods and apparatus for automated document examination for age verification. This system requests the presentation of a purchaser identification document when an age-restricted product is presented for purchase. The encoded information from the document is read, and a photograph of the purchaser is captured for comparison. The system evaluates the birth date encoded on the document to ensure that the purchaser meets the age requirements for the transaction. If the captured image matches the photograph, the purchase is authorized.

Another significant patent by Keys involves methods and apparatus for dynamic adjustment of barcode reader parameters. This innovation describes systems and techniques that enhance the accuracy of barcode detection and decoding. A rotating spinner in the barcode scanner reflects a laser beam to produce various scan patterns. The scanner continuously monitors the spinner's rotational position, allowing for adjustments to processing parameters to improve the reliability and accuracy of barcode detection.

Career Highlights

John Baird Keys is currently associated with NCR Corporation, where he applies his expertise in developing innovative solutions. His contributions have significantly impacted the efficiency of transaction processing systems.

Collaborations

Throughout his career, Keys has collaborated with notable colleagues, including Kenneth Joseph Fabian and Denis Michael Blanford. These partnerships have fostered a creative environment that encourages the development of groundbreaking technologies.

Conclusion

John Baird Keys exemplifies the spirit of innovation through his patents and contributions to technology. His work in automated systems and barcode processing continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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