Marietta, GA, United States of America

John Allen Christian

This inventor holds 1 USPTO granted patent. Top assignee: Rensselaer Polytechnic Institute. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John Allen Christian. Retrieved from https://idiyas.com/inventor/john-allen-christian

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: John Allen Christian and the StarNAV Optical Sensor System.

Introduction

John Allen Christian is an inventor associated with Marietta, Georgia, and Rensselaer Polytechnic Institute. His patent work includes a system for estimating spacecraft velocity using observations of starlight.

Latest Patents

Christian is credited with 1 patent, titled “StarNAV Optical Sensor System.” The invention describes a method for determining a spacecraft’s instantaneous velocity from a selected star-field image. It identifies pairs of stars, estimates the apparent bearing direction of stars in those pairs, and determines the apparent angle between each pair. A velocity estimation module then uses those angles to estimate the spacecraft’s velocity within a total velocity error.

Career Highlights

The StarNAV patent highlights Christian’s work on optical sensing and spacecraft navigation. By using apparent relationships between stars, the system offers an approach to estimating velocity from celestial observations.

Collaborations

Christian’s listed coworkers include Paul Dickson McKee and Michael Kudenov. His company affiliation is Rensselaer Polytechnic Institute.

Conclusion

John Allen Christian’s StarNAV patent describes a starlight-based method for estimating spacecraft velocity, reflecting an application of optical sensing to navigation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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