Eindhoven, Netherlands

John A M Verbruggen

This inventor holds 1 USPTO granted patent. Top assignee: Koninklijke Philips Corporation N.v.. Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John A M Verbruggen. Retrieved from https://idiyas.com/inventor/john-a-m-verbruggen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: Innovations of John A M Verbruggen

Introduction

John A M Verbruggen is a notable inventor based in Eindhoven, Netherlands. He has made significant contributions to the field of computed tomography. His work focuses on enhancing imaging technology, which is crucial for medical diagnostics.

Latest Patents

John A M Verbruggen holds a patent for a computed tomography device that includes a position measuring system. This innovative system features a gantry with an examination opening and is equipped with a position measuring system to accurately determine the gantry's position. The preferred method involves using an optical position measuring system that incorporates a camera unit, which is suspended from a point above the gantry.

Career Highlights

Verbruggen is associated with Koninklijke Philips Corporation N.V., a leading company in health technology. His work at Philips has allowed him to contribute to advancements in medical imaging and technology.

Collaborations

Some of his notable coworkers include Jantje E Wilting and Roland Proksa. Their collaboration has likely fostered an environment of innovation and creativity within the company.

Conclusion

John A M Verbruggen's contributions to computed tomography exemplify the importance of innovation in medical technology. His patent reflects a commitment to improving diagnostic tools that benefit healthcare professionals and patients alike.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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