This inventor holds 1 USPTO granted patent. Top assignee: U.S. Philips Corporation. Active years: 2001.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2001
Title: Johannes Pm Van Lammeren and Integrated Circuit Inspection.
Introduction
Johannes Pm Van Lammeren is an inventor associated with Nijmegen, the Netherlands. His work includes a patent for inspecting integrated circuits by measuring voltage drops in a sub-circuit’s supply line.
Latest Patents
The available information lists 1 patent for Van Lammeren: “Method for Inspecting an Integrated Circuit by Measuring a Voltage Drop in a Supply Line of a Sub-Circuit Thereof.” The method determines the supply current entering at least one sub-circuit while other sub-circuits remain operational. It measures the voltage across a segment of the relevant supply line, which contains no additional components to facilitate the measurement.
Career Highlights
Van Lammeren is associated with U.S. Philips Corporation. His patented method describes an approach to assessing integrated circuits through measurements made directly on a supply-line segment.
Collaborations
Taco Zwemstra is identified as Van Lammeren’s coworker.
Conclusion
Johannes Pm Van Lammeren’s listed patent focuses on measuring supply-line voltage to inspect integrated circuits, and his professional associations include U.S. Philips Corporation and coworker Taco Zwemstra.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile