Nijmegen, Netherlands

Johannes P M Van Lammeren

This inventor holds 2 USPTO granted patents. Top assignee: Koninklijke Philips Corporation N.v.. Active years: 2002-2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Johannes P M Van Lammeren. Retrieved from https://idiyas.com/inventor/johannes-p-m-van-lammeren

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2002-2004

Loading Chart...
2 patents (USPTO):Explore Patents

Title: Johannes P. M. Van Lammeren: Patents in Circuit Inspection and Amplifier Design.

Introduction

Johannes P. M. Van Lammeren is an inventor associated with Nijmegen, the Netherlands, and Koninklijke Philips Corporation N.V. His listed portfolio includes 2 patents concerning integrated-circuit inspection and amplifier design.

Latest Patents

One patent describes a method and apparatus for inspecting an integrated circuit containing multiple sub-circuits. The method determines the supply current of at least one sub-circuit while the others remain operational by measuring voltage across a segment of its supply line, without adding components to that line for measurement.

Another patent concerns an amplifier for video and/or audio equipment tuners. It uses at least two gain stages and switches that can short-circuit a stage when it is not needed, with the aim of amplifying the input signal while limiting noise and distortion.

Career Highlights

Van Lammeren’s listed inventions address practical challenges in electronic systems: measuring current within an integrated circuit and managing gain in tuner amplifiers. His work is associated with Koninklijke Philips Corporation N.V.

Collaborations

His listed coworkers include Taco Zwemstra and Clemens H. J. Mensink.

Conclusion

Johannes P. M. Van Lammeren’s patent work reflects contributions to integrated-circuit testing and low-noise amplifier design.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…