Terneuzen, Netherlands

Johannes P Laarhoven

This inventor holds 1 USPTO granted patent. Top assignee: Dow Nederland B.v.. Active years: 1989.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Johannes P Laarhoven. Retrieved from https://idiyas.com/inventor/johannes-p-laarhoven

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 1989

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1 patent (USPTO):Explore Patents

Title: Innovations of Johannes P. Laarhoven

Introduction

Johannes P. Laarhoven is an accomplished inventor based in Terneuzen, Netherlands. He has made significant contributions to the field of sample handling technology, particularly in the context of differential scanning calorimetry.

Latest Patents

Laarhoven holds a patent for an "Automatic Sample Handling Device." This innovative device is designed for the automatic handling of a multiplicity of samples, especially encapsulated samples, for evaluation on an individual basis. The device features a vacuum mechanism capable of transferring new samples to replace tested ones, along with a transfer mechanism that removes and replaces cover means to facilitate this process.

Career Highlights

Johannes P. Laarhoven is associated with Dow Nederland B.V., where he applies his expertise in developing advanced technologies. His work has been instrumental in enhancing the efficiency and accuracy of sample handling in scientific evaluations.

Collaborations

Some of his notable coworkers include Jan C. Torfs and Christiaan F. Van Heel, who have collaborated with him on various projects within the company.

Conclusion

Johannes P. Laarhoven's contributions to the field of sample handling technology exemplify his innovative spirit and dedication to advancing scientific research. His patent for the automatic sample handling device showcases his ability to solve complex challenges in laboratory environments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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