Linz, Austria

Johann Woegerbauer

This inventor holds 1 USPTO granted patent. Top assignee: Keba Ag. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Johann Woegerbauer. Retrieved from https://idiyas.com/inventor/johann-woegerbauer

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2017

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Johann Woegerbauer: Innovator in Precision Measurement Technology

Introduction

Johann Woegerbauer is a notable inventor based in Linz, Austria. He has made significant contributions to the field of precision measurement technology. His innovative approach has led to the development of a unique apparatus that enhances the accuracy of angle measurements between planar workpiece surfaces.

Latest Patents

Woegerbauer holds a patent for an "Apparatus for determining the angle between two planar workpiece surfaces." This invention involves a laser transmitter that emits a laser beam, a continuously rotating straightening rotor, and a receiving device that captures the reflected laser beam. The design aims to provide advantageous constructive conditions for measuring angles with high precision.

Career Highlights

Throughout his career, Johann Woegerbauer has been associated with Keba AG, a company known for its innovative solutions in automation and control technology. His work has focused on enhancing measurement techniques, which are crucial in various industrial applications.

Collaborations

Woegerbauer collaborates with his coworker, Andreas Woegerbauer, contributing to the advancement of their projects and innovations.

Conclusion

Johann Woegerbauer's contributions to precision measurement technology exemplify the impact of innovative thinking in engineering. His patented apparatus represents a significant advancement in the field, showcasing his dedication to improving measurement accuracy.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…