Pramet, Austria

Johann Reisinger

This inventor holds 1 USPTO granted patent and 2 published patent applications, plus 1 CIPO patent and 5 EPO patents. Top assignee: Merlin Technology, Inc.. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Johann Reisinger. Retrieved from https://idiyas.com/inventor/johann-reisinger

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

 

 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Johann Reisinger: Innovator in Defect Detection Technology

Introduction

Johann Reisinger is an inventor based in Plesching-Steyregg, Austria. He is currently employed at Voestalpine Stahl GmbH, where he contributes to advancements in technology related to defect detection. Although he has not yet been granted any patents, his work is significant in the field of quality assurance for metal products.

Latest Patent Applications

Johann Reisinger has submitted a patent application titled "Apparatus and Method for Detecting at Least One Periodically Occurring Defect on an Object." This innovative application focuses on detecting defects in moving objects, particularly metal strips. The method involves recording a time signal from the object and converting it into a quality function using a stochastic method. By inferring periodic signals from this quality function, the application aims to identify defects effectively. The use of a model-based estimation method, specifically a maximum likelihood method, enhances the reliability of the detection process.

Conclusion

Johann Reisinger's contributions to defect detection technology highlight his innovative approach to quality assurance in manufacturing. His ongoing work at Voestalpine Stahl GmbH and his recent patent application demonstrate his commitment to advancing the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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