Hamburg, Germany

Johann F Hipp

This inventor holds 1 USPTO granted patent. Top assignee: Wegman & Co. Gmbh. Active years: 1982.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Johann F Hipp. Retrieved from https://idiyas.com/inventor/johann-f-hipp

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 1982

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1 patent (USPTO):Explore Patents

Title: Johann F Hipp: Innovator in Mechanical-Optoelectronic Technology

Introduction

Johann F Hipp is a notable inventor based in Hamburg, Germany. He has made significant contributions to the field of mechanical-optoelectronic technology. His innovative work focuses on enhancing the functionality of combat vehicles through advanced engineering solutions.

Latest Patents

Hipp holds a patent for a mechanical-optoelectronic angle comparator. This invention is designed for determining the angular position relative to the line of sight of a weapon mounted on a combat vehicle. The device includes a sighting mechanism with an objective mirror that pivots on a first axis, parallel to the weapon's rotation axis. This invention showcases Hipp's expertise in integrating mechanical and optoelectronic systems.

Career Highlights

Johann F Hipp is associated with Wegman & Co. GmbH, where he applies his skills in developing cutting-edge technologies. His work at the company reflects his commitment to advancing military technology and improving operational efficiency in combat scenarios.

Collaborations

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Conclusion

Johann F Hipp's contributions to mechanical-optoelectronic technology exemplify his innovative spirit and dedication to enhancing military capabilities. His patent for the angle comparator is a testament to his engineering prowess and commitment to advancing technology in combat vehicles.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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