Nacka, Sweden

Johan Lagerros

This inventor holds 1 USPTO granted patent. Top assignee: Okinawa Institute of Science and Technology Promotion Corporation. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Johan Lagerros. Retrieved from https://idiyas.com/inventor/johan-lagerros

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Johan Lagerros: Innovator in Image Analysis

Introduction

Johan Lagerros is a notable inventor based in Nacka, Sweden. He has made significant contributions to the field of image analysis, particularly in solving ill-posed inverse problems. His innovative approach has implications for various applications, including electron tomography.

Latest Patents

Lagerros holds a patent titled "Iterated variational regularization combined with componentwise regularization." This invention provides a method for addressing challenges in image analysis by recovering the structure of a sample. The method involves several steps, including determining reliable prior knowledge, establishing an initial guess for the solution, and selecting a suitable regularization method.

Career Highlights

Johan Lagerros is affiliated with the Okinawa Institute of Science and Technology Promotion Corporation. His work at this institution has allowed him to explore advanced techniques in image analysis and contribute to the scientific community.

Collaborations

Lagerros has collaborated with notable colleagues, including Hans Rullgàrd and Anders Edin. These partnerships have enhanced his research and innovation efforts in the field.

Conclusion

Johan Lagerros is a distinguished inventor whose work in image analysis has led to valuable advancements. His patent demonstrates a commitment to solving complex problems in the field, showcasing his expertise and innovative spirit.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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