Company Filing History:
Years Active: 2012
Title: Joerg Richter: Innovator in Wafer Inspection Technology
Introduction
Joerg Richter is a notable inventor based in Weilburg, Germany. He has made significant contributions to the field of semiconductor technology, particularly in the area of wafer inspection. His innovative approach has led to the development of a unique method that enhances the detection sensitivity of wafer surfaces.
Latest Patents
Richter holds a patent for a "Method for inspecting a surface of a wafer with regions of different detection sensitivity." This invention addresses the challenges of inspecting wafer surfaces that have varying detection sensitivities. The method involves acquiring an image of the wafer's surface using a detector, allowing for the definition of regions with different detection sensitivities. The detection sensitivity for these regions is set at a percentage lower than that of the rest of the wafer surface, improving the overall inspection process.
Career Highlights
Joerg Richter is currently employed at Vistec Semiconductor Systems GmbH, where he continues to work on advancing semiconductor technologies. His expertise in wafer inspection has positioned him as a valuable asset to the company.
Collaborations
Richter collaborates with various professionals in the field, including his coworker Detlef Michelsson. Their combined efforts contribute to the ongoing innovation within the semiconductor industry.
Conclusion
Joerg Richter's contributions to wafer inspection technology exemplify the importance of innovation in the semiconductor field. His patented method not only enhances detection sensitivity but also showcases his commitment to advancing technology.