Pittsboro, IN, United States of America

Joel Taina

This inventor holds 1 USPTO granted patent. Top assignee: Allison Transmission, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Joel Taina. Retrieved from https://idiyas.com/inventor/joel-taina

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Joel Taina and Transmission Innovation.

Introduction

Joel Taina is an inventor associated with Pittsboro, Indiana, and Allison Transmission, Inc. His patent work addresses monitoring the operation and condition of multi-speed planetary transmissions.

Latest Patents

Taina is credited with 1 patent: “Slip Speed Monitoring of a Multi-Speed Planetary Transmission.” The invention describes a multi-speed transmission designed to provide at least eight forward speed ratios using planetary gearsets and selective couplers. One disclosed configuration uses four planetary gearsets and six selective couplers, comprising two clutches and four brakes.

A transmission controller operates the selective couplers and monitors their condition. The patent explains that speed sensors placed on selected rotating components can provide enough information to monitor slip speeds across all the couplers, supporting assessment of transmission health.

Career Highlights

Taina’s listed patent reflects work on transmission control and diagnostics, with a focus on using sensor data to monitor coupler slip. His professional affiliation is Allison Transmission, Inc.

Collaborations

Tristan Cox is identified as Taina’s coworker. The available information does not specify their roles in the patent or describe a particular collaboration.

Conclusion

Joel Taina’s patent focuses on monitoring selective-coupler slip in a multi-speed planetary transmission, linking transmission control with component-health assessment.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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