Mountain View, CA, United States of America

Joel M Blatt

USPTO Granted Patents = 13 


Average Co-Inventor Count = 2.7

ph-index = 9

Forward Citations = 1,446(Granted Patents)


Location History:

  • Granger, IN (US) (1988 - 1993)
  • Palo Alto, CA (US) (1998 - 2011)
  • Mountain View, CA (US) (2009 - 2014)

Company Filing History:


Years Active: 1988-2014

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13 patents (USPTO):Explore Patents

Title: Innovations of Joel M Blatt: A Pioneer in Analytical Systems

Introduction: Joel M Blatt is an accomplished inventor based in Mountain View, CA, known for his groundbreaking work in analytical systems and devices. With a portfolio of ten patents, he has made significant contributions to the fields of optical measurement and analyte detection, paving the way for advancements in diagnostic technologies.

Latest Patents: Among his latest inventions are two notable patents. The first is focused on analytical systems, devices, and cartridges designed for detecting or quantifying multiple analytes using different techniques within a single sample. These cartridges feature multiple test sites, and crucially, at least one test site's location is independent of a corresponding measurement device. The system includes a processing module for image analysis, a light source, and an array detector, all working in harmony to perform analysis.

The second invention is a method and device for measuring reflected optical radiation. This patent details a reflectometer designed to provide quantitative measurements of optical radiation reflected from a sampling area on an assay matrix. The device features an optical radiation source mounted in a single plane with a detector, facilitating precise analysis by directing illumination to the matrix and capturing the reflected radiation.

Career Highlights: Joel has worked for reputable companies, including Metrika, Inc. and Bayer Healthcare LLC. His dedication to innovation in analytical methods has earned him recognition in the field and contributed to the development of advanced diagnostic tools.

Collaborations: Throughout his career, Joel M Blatt has collaborated with esteemed professionals such as Michael P Allen and Joseph T Widunas. These partnerships have fostered an environment of creativity and technological advancement, enabling the development of effective solutions in analytical instrumentation.

Conclusion: Joel M Blatt stands out as a prolific inventor, with a keen focus on analytical systems and optical measurement technologies. His numerous patents reflect his ability to innovate and advance the field, making significant contributions that will likely shape the future of diagnostics and analytical measurement. His work exemplifies the spirit of invention, striving for excellence and improvement in scientific understanding and application.

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