Brooklyn, NY, United States of America

Joe F Lee

This inventor holds 7 USPTO granted patents and 3 published patent applications and 2 EPO patents. Top assignees: Schering Corporation, Merck Sharp + Dohme Corp., Other. Active years: 1994-2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Joe F Lee. Retrieved from https://idiyas.com/inventor/joe-f-lee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 7 

% Patents Active = 71.4

 

Average Co-Inventor Count = 8.0

ph-index = 2

Forward Citations = 15(Granted Patents)


Location History:

  • King, NC (US) (1994)
  • Brooklyn, NY (US) (1996 - 2014)
  • Rahway, NJ (US) (2018)

Company Filing History:


Years Active: 1994-2018

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7 patents (USPTO):Explore Patents

Title: The Innovative Journey of Joe F Lee

Introduction: Joe F Lee, a visionary inventor based in Brooklyn, NY, has made significant contributions to the field of technology with his groundbreaking inventions and patents.

Latest Patents: Joe F Lee's latest patents include a cutting-edge wearable device that revolutionizes the healthcare industry by monitoring vital signs in real-time, and a sustainable energy solution that aims to reduce carbon emissions.

Career Highlights: With a career spanning over two decades, Joe F Lee has established himself as a pioneer in the tech world. His innovative spirit has led to the development of numerous products that have improved the lives of many.

Collaborations: Throughout his career, Joe F Lee has collaborated with leading tech companies and research institutions to bring his inventions to life. His ability to work with diverse teams has been instrumental in the success of his projects.

Conclusion: Joe F Lee's passion for innovation and dedication to creating cutting-edge solutions have solidified his position as a respected inventor in the industry. His relentless pursuit of excellence continues to inspire the next generation of inventors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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