DE

Jochen Kuebler

This inventor holds 0 USPTO granted patents, plus 2 CIPO patents.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jochen Kuebler. Retrieved from https://idiyas.com/inventor/jochen-kuebler-2y8ash07

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

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Title: Jochen Kuebler: Innovator in Spatial Measurement Technology

Introduction

Jochen Kuebler is a notable inventor based in Germany, recognized for his contributions to the field of spatial measurement technology. His innovative approach has led to the development of a unique device designed for the spatially resolved measurement of physical variables.

Latest Patents

Jochen Kuebler holds a patent for a "Method And Device For Spatially Resolved Measuring Of A Physical Variable." This device includes several components, such as means for generating electrical signals of different frequencies, an optical radiation source, and a D/A converter for digitizing mixed signals. The technology aims to enhance the accuracy and efficiency of measuring physical variables in various applications.

Career Highlights

Kuebler is currently associated with Lios Technology GmbH, where he applies his expertise in developing advanced measurement solutions. His work has significantly impacted the industry, showcasing his commitment to innovation and excellence.

Collaborations

Throughout his career, Jochen Kuebler has collaborated with talented professionals, including Wieland Hill and Martin Fromme. These partnerships have fostered a creative environment that encourages the exchange of ideas and advancements in technology.

Conclusion

Jochen Kuebler's contributions to spatial measurement technology exemplify his dedication to innovation. His work continues to influence the field, paving the way for future advancements in measurement solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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