Worcester, MA, United States of America

Jocelyn Close


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Jocelyn Close

Introduction

Jocelyn Close is a notable inventor based in Worcester, MA (US). She has made significant contributions to the field of edge sharpness measurement. Her innovative work has led to the development of a unique apparatus that enhances the understanding of edge sharpness in various applications.

Latest Patents

Jocelyn Close holds a patent for an edge sharpness measurement apparatus. This apparatus includes a clamp for securing a test medium against a frictional member. It features an engagement mechanism for a normal force, which directs the test medium against the frictional member based on operational conditions. Additionally, there is a mechanism for a tangential force that increases the tangential force to identify the necessary force to dispose the frictional member across the test medium. A pivot defines the angle of application of the tangential force relative to the normal force, allowing for precise measurements of the tangential force sufficient to overcome frictional forces.

Career Highlights

Jocelyn Close is affiliated with Worcester Polytechnic Institute, where she continues to advance her research and innovation. Her work is characterized by a commitment to enhancing measurement techniques and improving the understanding of material properties.

Collaborations

Jocelyn has collaborated with notable colleagues, including Christopher Aldrich Brown and Jason Hopkins. These collaborations have further enriched her research and contributed to the development of her patented technology.

Conclusion

Jocelyn Close's contributions to edge sharpness measurement exemplify her innovative spirit and dedication to advancing technology. Her work not only enhances measurement techniques but also paves the way for future innovations in the field.

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