Cambridge, MA, United States of America

Joan Wortman


Average Co-Inventor Count = 3.4

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2017-2021

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2 patents (USPTO):Explore Patents

Title: Joan Wortman: Innovator in Model Performance Enhancement

Introduction

Joan Wortman is a distinguished inventor based in Cambridge, MA (US). She has made significant contributions to the field of model performance improvement, holding 2 patents that showcase her innovative approach to enhancing model efficiency.

Latest Patents

Her latest patents include a "System and method for improving model performance" and an "Interactive heat map for graphical model performance view." The first patent describes a system that intelligently and automatically enhances model performance by employing heuristics to select performance rules. These rules conform to specified criteria and include checks that offer advice on proposed changes to improve the model. The system evaluates these changes to determine their effectiveness, retaining those that enhance performance while discarding those that do not. The second patent involves a device that executes a model and collects data to generate a heat map. This heat map visually represents performance information associated with various elements of the model, providing a graphical interface that aids in performance analysis.

Career Highlights

Joan Wortman is currently employed at The MathWorks, Inc., where she continues to develop innovative solutions in model performance. Her work has had a profound impact on the efficiency of various modeling processes.

Collaborations

Throughout her career, Joan has collaborated with notable colleagues, including Robert Olson Aberg and Fu Zhang. These partnerships have further enriched her contributions to the field.

Conclusion

Joan Wortman's innovative work in model performance enhancement exemplifies her commitment to advancing technology. Her patents reflect her expertise and dedication to improving the efficiency of modeling processes.

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