Princeton, NJ, United States of America

Joakim Anden

This inventor holds 1 USPTO granted patent. Top assignee: Princeton University. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Joakim Anden. Retrieved from https://idiyas.com/inventor/joakim-anden

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2023

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Joakim Anden: Inventor in Electron Microscopy

Introduction

Joakim Anden is an inventor based in Princeton, New Jersey, and is associated with Princeton University. His work includes an invention for automatically identifying particle images in electron microscopy micrographs.

Latest Patents

Anden is credited with 1 patent: “Fully Automatic, Template-Free Particle Picking for Electron Microscopy.” The patent describes systems and methods that automatically locate and extract two-dimensional particle projections from a micrograph. The method selects reference images by analyzing partially overlapping image windows and comparing their statistical characteristics. It then uses normalized cross-correlation to identify other locations containing projections of the same type of particle. These projections can be used to help determine the particle’s three-dimensional structure.

Career Highlights

The patent addresses a key image-analysis task in electron microscopy: finding particle projections without relying on manually supplied templates. Automating this process can support the analysis of micrographs used in structural research.

Collaborations

The patent work is associated with Princeton University. Anden’s listed coworkers include Yuehaw Khoo and Amit Singer.

Conclusion

Joakim Anden’s patent applies automated image analysis to particle picking in electron microscopy, supporting the identification of particle projections for three-dimensional structural determination.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…