This inventor holds 1 USPTO granted patent. Top assignee: Scott Glas. Active years: 2005.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2005
Title: Innovations by Joachim Weber in Defect Detection Technology
Introduction
Joachim Weber is an accomplished inventor based in Mainz, Germany. He has made significant contributions to the field of defect detection in transparent materials. His innovative approach has led to the development of a unique method and apparatus that enhances the quality control processes in manufacturing.
Latest Patents
Weber holds a patent for a "Method and apparatus for detecting defects in a continuously moving strip of transparent material." This invention focuses on detecting defects in wide thin glass strips. The method involves guiding a narrow monochromatic light beam transverse to the motion direction of the moving strip. The light beam is coupled into the moving strip through a transparent liquid, which is strategically placed between the light source and the glass strip. This innovative approach allows for effective detection of defects, ensuring high-quality production standards.
Career Highlights
Joachim Weber has dedicated his career to advancing technologies in the field of materials science. He is currently associated with Scott Glas, where he continues to innovate and improve manufacturing processes. His work has been instrumental in enhancing the efficiency and accuracy of defect detection in transparent materials.
Collaborations
Weber collaborates with Klaus Gerstner, leveraging their combined expertise to push the boundaries of technology in their field. Their partnership has resulted in significant advancements in the methods used for quality control in manufacturing.
Conclusion
Joachim Weber's contributions to defect detection technology exemplify the impact of innovative thinking in manufacturing. His patent and ongoing work at Scott Glas highlight the importance of quality control in the production of transparent materials.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile