Bonn, Germany

Joachim Stilz

This inventor holds 5 USPTO granted patents and 1 published patent application. Top assignees: Stabila Messgerate Gustav Ullrich Gmbh, Stabila Messgeraete Gustav Ullrich Gmbh. Active years: 2012-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Joachim Stilz. Retrieved from https://idiyas.com/inventor/joachim-stilz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 5 

% Patents Active = 80.0

Average Co-Inventor Count = 1.0

ph-index = 3

Forward Citations = 22(Granted Patents)


Location History:

  • Bonn, DE (2012 - 2024)
  • Sinsheim, DE (2024)

Company Filing History:


Years Active: 2012-2026

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5 patents (USPTO):Explore Patents

Title: The Innovative Journey of Joachim Stilz

Introduction

Joachim Stilz is a notable inventor based in Bonn, Germany. He has made significant contributions to the field of technology, particularly with his innovative designs and inventions. With a total of four patents to his name, Stilz has demonstrated a commitment to advancing practical solutions in various applications.

Latest Patents

Among his latest patents are a laser device and a tape measure. These inventions showcase his ability to blend functionality with cutting-edge technology, providing users with enhanced tools for measurement and precision.

Career Highlights

Throughout his career, Joachim Stilz has worked with reputable companies, including Stabila-Messgeräte Gustav Ullrich GmbH and Stabila Messgeräte Gustav Ullrich GmbH. His experience in these organizations has allowed him to refine his skills and contribute to the development of innovative measurement devices.

Collaborations

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Conclusion

Joachim Stilz's journey as an inventor reflects his dedication to innovation and excellence in technology. His contributions continue to impact the industry positively, and his work serves as an inspiration for future inventors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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