Donaueschingen, Germany

Joachim Gässler

This inventor holds 1 USPTO granted patent and 3 EPO patents. Top assignee: Ioss Intelligente Optische Sensoren & Systeme Gmbh. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Joachim Gässler. Retrieved from https://idiyas.com/inventor/joachim-gässler

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


 

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Joachim Gässler

Introduction

Joachim Gässler is a notable inventor based in Donaueschingen, Germany. He has made significant contributions to the field of technology, particularly in the area of substrate concretizing methods. His work is characterized by a focus on enhancing the efficiency and reliability of code applications.

Latest Patents

Gässler holds a patent for a "Method for the concretizing of a substrate." This innovative method involves applying a code at least twice using a code reader. The process is designed to assign or match codes to restore an intact code from at least two codes that are not intact per se. This patent showcases his commitment to advancing technology in practical applications.

Career Highlights

Joachim Gässler is associated with Ioss Intelligente Optische Sensoren & Systeme GmbH, where he continues to develop and refine his inventions. His role at the company allows him to collaborate with other talented professionals in the field.

Collaborations

Some of his notable coworkers include Christian Konz and Harald Richter. Their collective expertise contributes to the innovative environment at Ioss.

Conclusion

Joachim Gässler's work exemplifies the spirit of innovation in technology. His contributions, particularly in substrate concretizing methods, highlight the importance of practical solutions in advancing industry standards.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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