Taiyuan, China

Jizhou Wu

This inventor holds 1 USPTO granted patent. Top assignee: Shanxi University. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jizhou Wu. Retrieved from https://idiyas.com/inventor/jizhou-wu-15jrpvfn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Jizhou Wu - Innovator in Portable Test Paper Counting Technology

Introduction

Jizhou Wu is a notable inventor based in Taiyuan, China. He has made significant contributions to the field of test paper counting technology. His innovative approach utilizes advanced detection methods to enhance the efficiency of testing processes.

Latest Patents

Jizhou Wu holds a patent for a "Portable test paper counting device and method based on single photon detector." This invention focuses on a portable device that incorporates a single photon detector to count test papers accurately. The device features a box-shaped housing, guide rail pairs, hanger rods, a laser, a reflecting mirror, a power supply, and a PC computer. The design includes an operating hole and assembly hole for improved functionality.

Career Highlights

Wu is affiliated with Shanxi University, where he continues to engage in research and development. His work emphasizes the integration of cutting-edge technology in practical applications. He has successfully developed a device that streamlines the counting process, making it more accessible and efficient.

Collaborations

Jizhou Wu collaborates with colleagues such as Jie Ma and Suya Song. Their combined expertise contributes to the advancement of innovative technologies in their field.

Conclusion

Jizhou Wu's contributions to portable test paper counting technology exemplify the impact of innovation in scientific research. His work not only enhances testing efficiency but also showcases the potential of advanced detection methods in practical applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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