This inventor holds 1 USPTO granted patent. Top assignee: Flextronics Ap, LLC. Active years: 2017.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2017
Title: Jiyang Zhang - Innovator in Glue Thickness Inspection Technology
Introduction
Jiyang Zhang is a notable inventor based in Milpitas, CA (US). He has made significant contributions to the field of material inspection technology. His innovative approach has led to the development of a specialized system for measuring glue thickness.
Latest Patents
Jiyang Zhang holds a patent for a Glue Thickness Inspection (GTI) system. This system automates the thickness measurement functionality for both non-transparent and transparent materials, including glue, gel, solder, and epoxy. The glue thickness inspection system features a laser detector, a movable platform for positioning the unit under test, and a controller that manages the platform's movement, the angle of the laser detector, and the calculation of the transparent material thickness. The laser detector emits laser light onto the unit under test, while a sensor receives the corresponding reflected light. The data sensed is utilized by the controller to accurately determine the thickness of the transparent material. He has 1 patent to his name.
Career Highlights
Jiyang Zhang is currently employed at Flextronics Ap, LLC, where he continues to innovate and develop advanced technologies. His work has been instrumental in enhancing the efficiency and accuracy of material inspection processes.
Collaborations
Some of his coworkers include Hongqiang Xie and An Qi Zhao, who contribute to the collaborative environment that fosters innovation at Flextronics Ap, LLC.
Conclusion
Jiyang Zhang's contributions to glue thickness inspection technology exemplify his commitment to innovation in material measurement. His work not only advances the field but also sets a standard for future developments in inspection systems.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
