Jiwei Tian

Title: Innovations of Jiwei Tian in Ocean Microstructure Measurement

Introduction

Jiwei Tian is a prominent inventor based in Qingdao, China, known for his contributions to oceanographic research. He holds a total of four patents, showcasing his innovative approach to measuring ocean microstructures. His work significantly enhances the accuracy and efficiency of oceanic measurements.

Latest Patents

One of Jiwei Tian's latest patents is a "Method for the measurement of turbulence by using reciprocating ocean microstructure profiler." This method involves several procedures, including system startup, detection of ocean dynamic environment information, and control of the profiler's ascending and descending operations. The system is designed to provide long-time continuous profile measurement at a fixed area along a steel cable, effectively eliminating measurement errors caused by water flow fluctuations. This results in highly precise ocean microstructure observations.

Another notable patent is the "Reciprocating ocean microstructure profiler," which consists of a first and second profiler subunit along with a central stand. Each subunit is equipped with buoyancy drive parts and observation components, allowing for efficient data collection. The design includes a floating compartment, drive compartment, and pressure housing, all working together to ensure accurate measurements.

Career Highlights

Jiwei Tian is affiliated with the Ocean University of China, where he conducts research and develops innovative technologies for ocean measurement. His work has garnered attention in the scientific community, contributing to advancements in oceanography.

Collaborations

Jiwei collaborates with notable colleagues such as Wei Zhao and Qingxuan Yang, further enhancing the impact of his research through teamwork and shared expertise.

Conclusion

Jiwei Tian's innovative patents and contributions to ocean microstructure measurement demonstrate his commitment to advancing oceanographic research. His work not only improves measurement accuracy but also paves the way for future innovations in the field.