The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2017
Filed:
Dec. 11, 2014
Ocean University of China, Qingdao, CN;
Jiwei Tian, Qingdao, CN;
Wei Zhao, Qingdao, CN;
Dalei Song, Qingdao, CN;
Qingxuan Yang, Qingdao, CN;
Ming Xu, Qingdao, CN;
OCEAN UNIVERSITY OF CHINA, Qingdao, Shandong, CN;
Abstract
The method for the measurement of turbulence by using reciprocating ocean microstructure profiler includes the following procedures: 1) system startup; 2) detection of the profile data of ocean dynamic environment information: a. temperature detection; b. shear detection; c. depth detection; and d. current and temperature & conductivity detection; e. gesture sensing; 3) control of ascending and descending operations of the profiler: a. uprising control; b. redirection operation; and c. sinking control; and 4) sleep mode. The method doesn't consume labor several times and the equipment is capable of providing long-time continuous profile measurement at a fixed area along a steel cable; and the entire system can ascend and descend steadily after hydrodynamic optimized layout, eliminating the measurement errors contributable to water flow fluctuation during detection, thus obtaining accurate ocean microstructure observation in vertical with higher precision.